IEEE

AFM Imaging Defect Detection and Classification Using Deep Learning

Abstract: Atomic Force Microscopy (AFM) has been a broadly used platform for high-resolution imaging and mechanical characterization of a wide range of samples. However, this technique can be ...
GitHub

dynaconf - Configuration Management for Python.

$ cd path/to/your/project/ $ dynaconf init -f toml ⚙️ Configuring your Dynaconf environment ----- 🐍 The file `config.py` was generated. 🎛️ settings.toml created to hold your settings. 🔑 ...
TMCnet

Kanazawa University research: High-speed AFM imaging reveals how brain enzyme forms dodecameric ring structure

Using high-speed atomic force microscopy (HS-AFM), the Kanazawa University team led by Mikihiro Shibata filmed the dynamic movements of CaMKII at the single-molecule level. The images revealed that a ...
IEEE

A Novel White Light Interference Based AFM Head

Abstract: A novel atomic force microscope (AFM) head based on white light interference (WLI) is developed for nanoscale surface measurement. In this head, instead of an optical beam deflection (OBD) ...